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Hot Carrier Design Considerations for MOS Devices and Circuits Cheng Wang Softcover reprint of the original 1st ed. 1992 edition
Hot Carrier Design Considerations for MOS Devices and Circuits
Cheng Wang
This book ad dresses these hot-carrier design issues for MOS devices and circuits, and is used primarily as a professional guide for process development engi neers, device engineers, and circuit designers who are interested in the latest developments in hot-carrier degradation modeling and hot-carrier reliability design techniques.
356 pages, black & white illustrations
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2012. gada 2. jūnijs |
| ISBN13 | 9781468485493 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 334 |
| Izmēri | 152 × 229 × 18 mm · 476 g |
| Valoda | Angļu |
| Redaktors | Wang, Cheng |
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