Sonia Ben Dhia

Electromagnetic Compatibility of Integrated Circuits: Techniques for low emission and susceptibility Sonia Ben Dhia 2006 edition

Marc Notes: Includes bibliographical references and index. Jacket Description/Back: Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented. Table of Contents: Basic Concepts in EMC for ICs.- Historical Review and State-of-the art.- Fundamentals and Theory.- Measurement Methods.- EMC Modeling.- Case Studies.- Guidelines.

Contributor Bio:  Sicard, Etienne Dr. Etienne Sicard is Professor of Electronic Engineering at the ISNA Electronic Engineering School of Toulouse. He has taught at the University of Balearic Islands, Spain, and the University of Osaka, Japan. He is the author of several educational software packages in microelectronics and sound processing. Dr. Sonia Delmas Bendhia is a Senior Lecturer in the Department of Electrical and Computer Engineering at the INSA Electronic Engineering School of Toulouse.