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Analog IC Reliability in Nanometer CMOS - Analog Circuits and Signal Processing Elie Maricau 2013 edition
Analog IC Reliability in Nanometer CMOS - Analog Circuits and Signal Processing
Elie Maricau
This book focuses on modeling, simulation and analysis of analog circuit aging. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared.
240 pages, 68 black & white illustrations, 27 colour illustrations, 16 black & white tables
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2013. gada 9. janvāris |
| ISBN13 | 9781461461623 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 198 |
| Izmēri | 160 × 243 × 17 mm · 453 g |
| Valoda | Angļu |