Pastāsti draugiem par šo preci:
Yield and Variability Optimization of Integrated Circuits Jian Cheng Zhang Softcover reprint of the original 1st ed. 1995 edition
Yield and Variability Optimization of Integrated Circuits
Jian Cheng Zhang
Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications.
234 pages, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2012. gada 2. novembris |
| Oriģinālā izdošanas datums | 1995 |
| ISBN13 | 9781461359357 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 234 |
| Izmēri | 155 × 235 × 13 mm · 362 g |
| Valoda | Angļu |
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