Scanning Electron Microscopy and X Ray Microanalysis - Joseph Goldstein - Grāmatas - Springer-Verlag New York Inc. - 9781461349693 - 2013. gada 31. maijs
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Scanning Electron Microscopy and X Ray Microanalysis 3rd ed. 2003. Softcover reprint of the original 3r edition

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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.


709 pages, biography

Mediji Grāmatas     Book
Izlaists 2013. gada 31. maijs
ISBN13 9781461349693
Izdevēji Springer-Verlag New York Inc.
Lapas 689
Izmēri 255 × 182 × 43 mm   ·   1,22 kg
Valoda Angļu  

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