Pastāsti draugiem par šo preci:
Built-in-Self-Test and Digital Self-Calibration for RF SoCs - SpringerBriefs in Electrical and Computer Engineering Sleiman Bou-Sleiman 2012 edition
Built-in-Self-Test and Digital Self-Calibration for RF SoCs - SpringerBriefs in Electrical and Computer Engineering
Sleiman Bou-Sleiman
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
106 pages, 70 black & white illustrations, 7 black & white tables, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2011. gada 22. septembris |
| ISBN13 | 9781441995476 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 89 |
| Izmēri | 155 × 235 × 5 mm · 163 g |
| Valoda | Angļu |