Pastāsti draugiem par šo preci:
Yield Simulation for Integrated Circuits - the Springer International Series in Engineering and Computer Science D.m.h. Walker 1st Ed. Softcover of Orig. Ed. 1987 edition
Yield Simulation for Integrated Circuits - the Springer International Series in Engineering and Computer Science
D.m.h. Walker
209 pages, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2010. gada 10. decembris |
| ISBN13 | 9781441952011 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 209 |
| Izmēri | 155 × 235 × 12 mm · 317 g |
| Valoda | Angļu |