Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing - Manoj Sachdev - Grāmatas - Springer-Verlag New York Inc. - 9781441942852 - 2010. gada 10. novembris
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing Softcover reprint of hardcover 2nd ed. 2007 edition

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The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.


328 pages, black & white illustrations

Mediji Grāmatas     Paperback Book   (Grāmata ar mīksto vāku un līmēto muguru)
Izlaists 2010. gada 10. novembris
ISBN13 9781441942852
Izdevēji Springer-Verlag New York Inc.
Lapas 328
Izmēri 155 × 235 × 18 mm   ·   494 g
Valoda Angļu  

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