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Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices
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Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas.
408 pages, Illustrations
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2008. gada 30. maijs |
| ISBN13 | 9780863417450 |
| Izdevēji | Institution of Engineering and Technolog |
| Lapas | 408 |
| Izmēri | 159 × 232 × 23 mm · 612 g |
| Redaktors | Sun, Yichuang |
