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Characterization of High Tc Materials and Devices by Electron Microscopy Nigel D Browning
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Characterization of High Tc Materials and Devices by Electron Microscopy
Nigel D Browning
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
406 pages, 267 b/w illus. 3 tables
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2000. gada 6. jūlijs |
| ISBN13 | 9780521554909 |
| Izdevēji | Cambridge University Press |
| Lapas | 406 |
| Izmēri | 251 × 177 × 32 mm · 864 g |
| Valoda | Angļu |
| Redaktors | Browning, Nigel D. (University of Illinois, Chicago) |
| Redaktors | Pennycook, Stephen J. (Oak Ridge National Laboratory, Tennessee) |
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