Pastāsti draugiem par šo preci:
Characterization of High Tc Materials and Devices by Electron Microscopy Nigel D Browning
Cena
€ 63,49
Pasūtīts no attālās noliktavas
Paredzamā piegāde . gada 18. aug. - . gada 1. sept.
Saņemiet paziņojumus par jauniem Nigel D Browning izdevumiem
Mūsu klienti saka:
Pievienot savam iMusic vēlmju sarakstam
Pieejams arī kā:
Characterization of High Tc Materials and Devices by Electron Microscopy
Nigel D Browning
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
408 pages, 267 b/w illus. 3 tables
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2006. gada 23. novembris |
| ISBN13 | 9780521031707 |
| Izdevēji | Cambridge University Press |
| Lapas | 408 |
| Izmēri | 168 × 243 × 21 mm · 669 g |
| Valoda | Angļu |
| Redaktors | Browning, Nigel D. (University of Illinois, Chicago) |
| Redaktors | Pennycook, Stephen J. (Oak Ridge National Laboratory, Tennessee) |
Vairāk no tā paša izdevēja
Skatīt visus Nigel D Browning ( piem., Hardcover Book un Paperback Book )