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Accelerated Testing: Statistical Models, Test Plans, and Data Analysis - Wiley Series in Probability and Statistics Nelson, Wayne B. (California Institute of Technology (Caltech); University of Illinois) 2 Revised edition
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Accelerated Testing: Statistical Models, Test Plans, and Data Analysis - Wiley Series in Probability and Statistics
Nelson, Wayne B. (California Institute of Technology (Caltech); University of Illinois)
Useful methodology has been developed in accelerated testing. This work deals with the topic Accelerated Testing: Statistical Models, Test Plans, and Data Analyses. It is useful for practitioners.
624 pages, black & white illustrations, figures
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2007. gada 1. decembris |
| Oriģinālā izdošanas datums | 2004 |
| ISBN13 | 9780471697367 |
| Izdevēji | John Wiley & Sons Inc |
| Lapas | 624 |
| Izmēri | 154 × 232 × 38 mm · 820 g |
| Valoda | Angļu |
