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Applied Life Data Analysis - Wiley Series in Probability and Statistics Nelson, Wayne B. (California Institute of Technology (Caltech); University of Illinois)
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Applied Life Data Analysis - Wiley Series in Probability and Statistics
Nelson, Wayne B. (California Institute of Technology (Caltech); University of Illinois)
WILEY--INTERSCIENCE PAPERBACK SERIES The Wiley--Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation.
662 pages, illustrations
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2003. gada 8. decembris |
| Oriģinālā izdošanas datums | 2004 |
| ISBN13 | 9780471644620 |
| Izdevēji | John Wiley & Sons Inc |
| Lapas | 664 |
| Izmēri | 159 × 238 × 37 mm · 848 g |
| Valoda | Angļu |
![Cover for Nelson, Wayne B. (California Institute of Technology (Caltech); University of Illinois) · Accelerated Testing: Statistical Models, Test Plans, and Data Analysis - Wiley Series in Probability and Statistics (Paperback Book) [2 Revised edition] (2007)](https://imusic.b-cdn.net/images/item/original/367/9780471697367.jpg?nelson-wayne-b-california-institute-of-technology-caltech-university-of-illinois-2007-accelerated-testing-statistical-models-test-plans-and-data-analysis-wiley-series-in-probability-and-statistics-paperback-book&class=scaled&v=1412958069)
