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Rapid Reliability Assessment of VLSICs A.P. Dorey 1990 edition
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Rapid Reliability Assessment of VLSICs
A.P. Dorey
The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service.
200 pages, bibliography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 1990. gada 30. aprīlis |
| ISBN13 | 9780306434921 |
| Izdevēji | Springer Science+Business Media |
| Lapas | 212 |
| Izmēri | 150 × 220 × 20 mm · 504 g (Svars (aptuveni)) |
| Valoda | Angļu |