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izlaidumi no Meyer, J. Patrick (University of Virginia, USA)

Cover for Meyer, J. Patrick (University of Virginia, USA) · Applied Measurement with jMetrik (Hardcover Book) (2014)
Hardcover Book
1. izdevums
Applied Measurement with jMetrik
Meyer, J. Patrick (University of...
Cover for Meyer, J. Patrick (University of Virginia, USA) · Applied Measurement with jMetrik (Paperback Book) (2014)
Paperback Book
1. izdevums
Applied Measurement with jMetrik
Meyer, J. Patrick (University of...