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X-Ray Scattering Techniques for Epitaxial Oxide Thin Films
X-Ray Scattering Techniques for Epitaxial Oxide Thin Films
The first chapter considers laboratory-based X-ray diffraction (XRD) methods: the indispensable X-ray characterization methods used for phase analysis, epitaxial relationship determination, advanced analytical and data fitting techniques, and grazing incidence diffraction.
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2025. gada 12. augusts |
| ISBN13 | 9789819659449 |
| Izdevēji | Springer Nature Switzerland AG |
| Lapas | 186 |
| Izmēri | 150 × 220 × 20 mm · 453 g |
| Redaktors | Evans, Paul G. |
| Redaktors | Sando, Daniel |
| Redaktors | Valanoor, Nagarajan |