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Fundamentals of Atomic Force Microscopy - Part I: Foundations - Lessons from Nanoscience: a Lecture Notes Series Reifenberger, Ronald (Purdue University, USA)
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Fundamentals of Atomic Force Microscopy - Part I: Foundations - Lessons from Nanoscience: a Lecture Notes Series
Reifenberger, Ronald (Purdue University, USA)
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution.
350 pages
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2015. gada 12. novembris |
| ISBN13 | 9789814630351 |
| Izdevēji | World Scientific Publishing Co Pte Ltd |
| Lapas | 342 |
| Izmēri | 229 × 155 × 19 mm · 492 g |
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