Pastāsti draugiem par šo preci:
Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach Xiaowei Li 2023 edition
Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
Xiaowei Li
The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs.
304 pages, 1 Illustrations, black and white; XVIII, 304 p. 1 illus.
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2024. gada 3. marts |
| ISBN13 | 9789811985539 |
| Izdevēji | Springer Verlag, Singapore |
| Lapas | 304 |
| Izmēri | 150 × 220 × 10 mm · 493 g |