Pastāsti draugiem par šo preci:
Thermal Conductivity Measurements in Atomically Thin Materials and Devices - SpringerBriefs in Applied Sciences and Technology T. Serkan Kasirga 2020 edition
Thermal Conductivity Measurements in Atomically Thin Materials and Devices - SpringerBriefs in Applied Sciences and Technology
T. Serkan Kasirga
This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications.
50 pages, 21 Illustrations, color; 3 Illustrations, black and white; XV, 50 p. 24 illus., 21 illus.
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2020. gada 20. maijs |
| ISBN13 | 9789811553479 |
| Izdevēji | Springer Verlag, Singapore |
| Lapas | 50 |
| Izmēri | 150 × 220 × 10 mm · 454 g |