VLSI Design and Test -  - Grāmatas - Springer Verlag, Singapore - 9789811074691 - 2017. gada 22. decembris
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VLSI Design and Test 1st ed. 2017 edition

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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions.


815 pages, 486 Illustrations, black and white; XXI, 815 p. 486 illus.

Mediji Grāmatas     Book
Izlaists 2017. gada 22. decembris
ISBN13 9789811074691
Izdevēji Springer Verlag, Singapore
Lapas 815
Izmēri 150 × 220 × 20 mm   ·   1,25 kg
Redaktors Dasgupta, Sudeb
Redaktors Kaushik, Brajesh Kumar
Redaktors Singh, Virendra

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