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CMOS RF Circuit Design for Reliability and Variability - SpringerBriefs in Applied Sciences and Technology Jiann-Shiun Yuan 1st ed. 2016 edition
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CMOS RF Circuit Design for Reliability and Variability - SpringerBriefs in Applied Sciences and Technology
Jiann-Shiun Yuan
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits.
106 pages, 101 black & white illustrations, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2016. gada 21. aprīlis |
| ISBN13 | 9789811008825 |
| Izdevēji | Springer Verlag, Singapore |
| Lapas | 106 |
| Izmēri | 155 × 235 × 6 mm · 1,83 kg |
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