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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications - Springer Series in Advanced Microelectronics Jacopo Franco 2014 edition
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications - Springer Series in Advanced Microelectronics
Jacopo Franco
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
206 pages, 219 black & white illustrations, biography
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