Design for Manufacturability and Yield for Nano-scale Cmos - Integrated Circuits and Systems - Charles Chiang - Grāmatas - Springer - 9789048173037 - 2010. gada 22. novembris
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Design for Manufacturability and Yield for Nano-scale Cmos - Integrated Circuits and Systems 1st Ed. Softcover of Orig. Ed. 2007 edition

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This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.


255 pages, biography

Mediji Grāmatas     Paperback Book   (Grāmata ar mīksto vāku un līmēto muguru)
Izlaists 2010. gada 22. novembris
ISBN13 9789048173037
Izdevēji Springer
Lapas 255
Izmēri 156 × 234 × 15 mm   ·   408 g
Valoda Angļu  

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