Pastāsti draugiem par šo preci:
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond Andrej Rumiantsev
Cena
€ 138,49
Pasūtīts no attālās noliktavas
Paredzamā piegāde . gada 11. - 25. sept.
Saņemiet paziņojumus par jauniem Andrej Rumiantsev izdevumiem
Mūsu klienti saka:
Pievienot savam iMusic vēlmju sarakstam
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond
Andrej Rumiantsev
This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.
250 pages
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2019. gada 31. jūlijs |
| ISBN13 | 9788770221122 |
| Izdevēji | River Publishers |
| Lapas | 278 |
| Izmēri | 150 × 220 × 20 mm · 526 g |
