Pastāsti draugiem par šo preci:
Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics Souvik Mahapatra 1st ed. 2015 edition
Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics
Souvik Mahapatra
269 pages, 133 black & white illustrations, 68 colour illustrations, 17 black & white tables, biogra
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2015. gada 14. augusts |
| ISBN13 | 9788132225072 |
| Izdevēji | Springer, India, Private Ltd |
| Lapas | 269 |
| Izmēri | 155 × 235 × 20 mm · 652 g |
| Redaktors | Mahapatra, Souvik |