Investigations on Magnetron Sputtered Tantalum Oxide Films: Microelectronic Device Applications - G Mohan Rao - Grāmatas - LAP LAMBERT Academic Publishing - 9783843394222 - 2011. gada 18. janvāris
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Investigations on Magnetron Sputtered Tantalum Oxide Films: Microelectronic Device Applications

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High permittivity dielectrics are studied intensively in the view of their use in the integrated circuits. However, the real emergence of tantalum oxide (Ta2O5) as a dielectric material happened due to its high-dielectric constant, chemical and thermal stability with the promise of compatibility in microelectronic processing. This book covenants with the optimized deposition conditions of Ta2O5 films formed on quartz and p-type Si substrates using dc and rf reactive magnetron sputtering method for structural and optical studies. Further, aluminum metal deposited as a top electrode on Ta2O5 and Si stack to prepare metal oxide semiconductor device for investigating electrical and dielectric properties. The possible ways for depositing good quality Ta2O5 layers on Si, to obtain high dielectric constant explained in this book are quite useful to prepare high quality metal oxide semiconductor device for capacitor applications.

Mediji Grāmatas     Paperback Book   (Grāmata ar mīksto vāku un līmēto muguru)
Izlaists 2011. gada 18. janvāris
ISBN13 9783843394222
Izdevēji LAP LAMBERT Academic Publishing
Lapas 188
Izmēri 226 × 11 × 150 mm   ·   298 g
Valoda Vācu