Pastāsti draugiem par šo preci:
Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications - Springer Series in Materials Science Andrei Benediktovich Softcover reprint of the original 1st ed. 2014 edition
Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications - Springer Series in Materials Science
Andrei Benediktovich
The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis.
331 pages, 71 black & white illustrations, 37 colour illustrations, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2016. gada 27. augusts |
| ISBN13 | 9783662520543 |
| Izdevēji | Springer-Verlag Berlin and Heidelberg Gm |
| Lapas | 318 |
| Izmēri | 155 × 235 × 18 mm · 467 g |
| Valoda | Vācu |
Ziemassvētku dāvanas var atgriezt līdz 31. janvārim