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X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 - Springer Series in Optical Sciences David Sayre Softcover reprint of the original 1st ed. 1988 edition
X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 - Springer Series in Optical Sciences
David Sayre
This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987.
455 pages, 286 black & white illustrations, 2 colour illustrations, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2013. gada 3. oktobris |
| ISBN13 | 9783662144909 |
| Izdevēji | Springer-Verlag Berlin and Heidelberg Gm |
| Lapas | 455 |
| Izmēri | 152 × 229 × 24 mm · 625 g |
| Valoda | Vācu |
| Redaktors | Howells, Malcolm |
| Redaktors | Kirz, Janos |
| Redaktors | Rarback, Harvey |
| Redaktors | Sayre, David |
Ziemassvētku dāvanas var atgriezt līdz 31. janvārim