Study on Yield Related Traits in Wheat: Estimation of Heritability and Genetic Advance for Yield and Yield Related Traits in Bread Wheat - Obaidullah Khan - Grāmatas - LAP LAMBERT Academic Publishing - 9783659489051 - 2013. gada 30. novembris
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Study on Yield Related Traits in Wheat: Estimation of Heritability and Genetic Advance for Yield and Yield Related Traits in Bread Wheat

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Need for the improvement in wheat yield is increasing continuously due to day by day increase in human population on the same land. This challenge is much greater in the developing countries than the developed world. Many breeding programs are based on selection of desirable parents for hybridization that?s the main source to create genetic variation which is heritable to offspring. This study was carried out to have information on the magnitude of heritability and genetic advance of various important wheat parameters as it plays an important role for planning breeding strategy. For this purpose second filial (F2) generation of ten cross combinations involving seven wheat varieties/genotypes were studied. These were planted in field in a Randomized Complete Block Design with three replications. At maturity 200 plants from each cross and 20 plants from each parent were taken and data were recorded. The information derived will be very helpful to make improvement in wheat yield through reliable selection as it is suggested that varieties/genotypes showing good results should be given due importance in future breeding programs.

Mediji Grāmatas     Paperback Book   (Grāmata ar mīksto vāku un līmēto muguru)
Izlaists 2013. gada 30. novembris
ISBN13 9783659489051
Izdevēji LAP LAMBERT Academic Publishing
Lapas 100
Izmēri 150 × 6 × 226 mm   ·   167 g
Valoda Vācu