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Noncontact Atomic Force Microscopy - NanoScience and Technology S Morita Softcover reprint of the original 1st ed. 2002 edition
Noncontact Atomic Force Microscopy - NanoScience and Technology
S Morita
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS);
458 pages, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2012. gada 23. oktobris |
| ISBN13 | 9783642627729 |
| Izdevēji | Springer-Verlag Berlin and Heidelberg Gm |
| Lapas | 440 |
| Izmēri | 155 × 235 × 24 mm · 639 g |
| Valoda | Vācu |
| Redaktors | Meyer, E. |
| Redaktors | Morita, S. |
| Redaktors | Wiesendanger, Roland |