Pastāsti draugiem par šo preci:
Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications - Springer Series in Materials Science Andrei Benediktovich 2014 edition
Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications - Springer Series in Materials Science
Andrei Benediktovich
The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis.
310 pages, 71 black & white illustrations, 37 colour illustrations, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2013. gada 18. septembris |
| ISBN13 | 9783642381768 |
| Izdevēji | Springer-Verlag Berlin and Heidelberg Gm |
| Lapas | 318 |
| Izmēri | 155 × 235 × 23 mm · 521 g |
| Valoda | Vācu |
Ziemassvētku dāvanas var atgriezt līdz 31. janvārim