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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis - Springer Series in Optical Sciences Ludwig Reimer 2nd completely rev. and updated ed. 1998 edition
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis - Springer Series in Optical Sciences
Ludwig Reimer
The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
529 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 1998. gada 17. septembris |
| ISBN13 | 9783540639763 |
| Izdevēji | Springer-Verlag Berlin and Heidelberg Gm |
| Lapas | 529 |
| Izmēri | 242 × 166 × 34 mm · 975 g |
| Valoda | Vācu |
| Ieguldītājs | Peter W Hawkes |
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