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Noncontact Atomic Force Microscopy - NanoScience and Technology Roland Wiesendanger 2002 edition
Noncontact Atomic Force Microscopy - NanoScience and Technology
Roland Wiesendanger
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS);
458 pages, biography
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2002. gada 24. jūlijs |
| ISBN13 | 9783540431176 |
| Izdevēji | Springer-Verlag Berlin and Heidelberg Gm |
| Lapas | 440 |
| Izmēri | 164 × 241 × 35 mm · 766 g |
| Valoda | Vācu |
| Redaktors | Meyer, E. |
| Redaktors | Morita, S. |
| Redaktors | Wiesendanger, Roland |
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