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Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications G Friedbacher 2nd, Completely Revised and Enlarged edition
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Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications
G Friedbacher
Completely revised and updated, this second edition of a bestseller surveys and compares all techniques relevant for practical applications. New chapters cover such recent methods as SNOM, SERS, and laser ablation. With over 500 references and a list of equipment suppliers.
558 pages, Illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2011. gada 20. aprīlis |
| ISBN13 | 9783527320479 |
| Izdevēji | Wiley-VCH Verlag GmbH |
| Lapas | 558 |
| Izmēri | 248 × 182 × 31 mm · 1,19 kg |
| Valoda | Angļu |
| Redaktors | Bubert, Henning (Institute of Spectrochemistry and Applied Spectroscopy, Dortmund, Germany) |
| Redaktors | Friedbacher, Gernot (Vienna University of Technology, Vienna, Austria) |
