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Contactless VLSI Measurement and Testing Techniques Selahattin Sayil Softcover reprint of the original 1st ed. 2018 edition
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Contactless VLSI Measurement and Testing Techniques
Selahattin Sayil
The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.
93 pages, 11 Illustrations, color; 23 Illustrations, black and white; V, 93 p. 34 illus., 11 illus.
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2018. gada 4. septembris |
| ISBN13 | 9783319888194 |
| Izdevēji | Springer International Publishing AG |
| Lapas | 93 |
| Izmēri | 150 × 220 × 10 mm · 184 g |
| Valoda | Vācu |
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