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Helium Ion Microscopy - NanoScience and Technology Softcover reprint of the original 1st ed. 2016 edition
Helium Ion Microscopy - NanoScience and Technology
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.
526 pages, 100 Tables, color; 204 Illustrations, color; 116 Illustrations, black and white; XXIII, 5
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2018. gada 16. jūnijs |
| ISBN13 | 9783319824734 |
| Izdevēji | Springer International Publishing AG |
| Lapas | 526 |
| Izmēri | 156 × 234 × 32 mm · 814 g |
| Valoda | Vācu |
| Redaktors | Golzhauser, Armin |
| Redaktors | Hlawacek, Gregor |