Pastāsti draugiem par šo preci:
Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU project iRel40
Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU project iRel40
This book describes the latest progress in reliability analysis of microelectronic products. More importantly, this book tries to present methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of electronic devices.
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2025. gada 14. jūlijs |
| ISBN13 | 9783031593635 |
| Izdevēji | Springer International Publishing AG |
| Lapas | 403 |
| Izmēri | 150 × 220 × 10 mm · 633 g |
| Valoda | Vācu |
| Redaktors | Pressel, Klaus |
| Redaktors | Soyturk, Mujdat |
| Redaktors | Van Driel, Willem Dirk |