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Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation Fangzhou Xia 2024 edition
Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation
Fangzhou Xia
From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM).
370 pages, 200 Tables, color; 125 Illustrations, color; 13 Illustrations, black and white; XXIV, 370
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2024. gada 7. februāris |
| ISBN13 | 9783031442322 |
| Izdevēji | Springer International Publishing AG |
| Lapas | 366 |
| Izmēri | 150 × 220 × 20 mm · 823 g |
| Valoda | Vācu |