Pastāsti draugiem par šo preci:
Interconnect Reliability in Advanced Memory Device Packaging - Springer Series in Reliability Engineering Gan, Chong Leong, 2023 edition
Interconnect Reliability in Advanced Memory Device Packaging - Springer Series in Reliability Engineering
Gan, Chong Leong,
This book explains mechanical and thermal reliability for modern memory packaging, considering materials, processes, and manufacturing. In the past 40 years, memory packaging processes have evolved enormously.
210 pages, 50 Tables, color; 89 Illustrations, color; 11 Illustrations, black and white; XVIII, 210
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2023. gada 29. aprīlis |
| ISBN13 | 9783031267079 |
| Izdevēji | Springer International Publishing AG |
| Lapas | 210 |
| Izmēri | 150 × 220 × 20 mm · 553 g |
| Valoda | Vācu |