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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies Antonio Manuel Lourenco Canelas 2020 edition
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Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
Antonio Manuel Lourenco Canelas
This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm.
237 pages, 87 Tables, color; 97 Illustrations, color; 42 Illustrations, black and white; XXIII, 237
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2021. gada 21. marts |
| ISBN13 | 9783030415389 |
| Izdevēji | Springer Nature Switzerland AG |
| Lapas | 237 |
| Izmēri | 150 × 220 × 10 mm · 371 g |
| Valoda | Vācu |
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