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Noise in Nanoscale Semiconductor Devices 2020 edition
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Noise in Nanoscale Semiconductor Devices
III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.
729 pages, 443 Illustrations, color; 107 Illustrations, black and white; VI, 729 p. 550 illus., 443
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2021. gada 27. aprīlis |
| ISBN13 | 9783030375027 |
| Izdevēji | Springer Nature Switzerland AG |
| Lapas | 729 |
| Izmēri | 157 × 233 × 41 mm · 1,08 kg |
| Valoda | Vācu |
| Redaktors | Grasser, Tibor |
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