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Electrical Atomic Force Microscopy for Nanoelectronics - NanoScience and Technology 2019 edition
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Electrical Atomic Force Microscopy for Nanoelectronics - NanoScience and Technology
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.
408 pages, 60 Tables, color; 230 Illustrations, color; 26 Illustrations, black and white; XX, 408 p.
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2020. gada 25. augusts |
| ISBN13 | 9783030156145 |
| Izdevēji | Springer Nature Switzerland AG |
| Lapas | 408 |
| Izmēri | 150 × 220 × 10 mm · 652 g |
| Valoda | Vācu |
| Redaktors | Celano, Umberto |
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