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X-ray Scattering from Semiconductors (2nd Edition) Fewster, Paul F (PANalytical Research Centre, UK) 2 Revised edition
X-ray Scattering from Semiconductors (2nd Edition)
Fewster, Paul F (PANalytical Research Centre, UK)
A practical guide to the analysis of materials, including a description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general.
316 pages, Illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2003. gada 8. jūlijs |
| ISBN13 | 9781860943607 |
| Izdevēji | Imperial College Press |
| Lapas | 316 |
| Izmēri | 154 × 230 × 24 mm · 666 g |
| Valoda | Angļu |