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Nanometer-scale Defect Detection Using Polarized Light Dahoo, Pierre-Richard (University of Versailles Saint-Quentin, France)
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Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre-Richard (University of Versailles Saint-Quentin, France)
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
316 pages, black & white illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2016. gada 12. augusts |
| ISBN13 | 9781848219366 |
| Izdevēji | ISTE Ltd and John Wiley & Sons Inc |
| Lapas | 320 |
| Izmēri | 165 × 241 × 23 mm · 612 g |
