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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization Chandra Shakher Pathak
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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
Chandra Shakher Pathak
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
274 pages
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2022. gada 7. janvāris |
| ISBN13 | 9781839682292 |
| Izdevēji | IntechOpen |
| Lapas | 274 |
| Izmēri | 180 × 260 × 17 mm · 639 g |
| Valoda | Angļu |
| Redaktors | Kumar, Samir |
| Redaktors | Pathak, Chandra Shakher |
