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Design and Test Technology for Dependable Systems-on-chip (Premier Reference Source) Raimund Ubar 1. izdevums
Design and Test Technology for Dependable Systems-on-chip (Premier Reference Source)
Raimund Ubar
Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences.
Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2011. gada 31. marts |
| ISBN13 | 9781609602123 |
| Izdevēji | IGI Global |
| Lapas | 578 |
| Izmēri | 218 × 284 × 36 mm · 1,61 kg |
| Valoda | Angļu |
| Ieguldītājs | Heinrich Theodor Vierhaus |
| Ieguldītājs | Jaan Raik |
| Ieguldītājs | Raimund Ubar |
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