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Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156 - MRS Proceedings M Gall
Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156 - MRS Proceedings
M Gall
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
189 pages, illustrations
| Mediji | Grāmatas Hardcover Book (Grāmata ar cieto muguriņu un vāku) |
| Izlaists | 2009. gada 18. novembris |
| ISBN13 | 9781605111292 |
| Izdevēji | Materials Research Society |
| Lapas | 204 |
| Izmēri | 160 × 235 × 15 mm · 400 g |
| Valoda | Angļu |
| Redaktors | Gall, Martin |
| Redaktors | Grill, Alfred (IBM T J Watson Research Center, New York) |
| Redaktors | Koike, Junichi (Tohoku University, Japan) |
| Redaktors | Lacopi, Francesca |
| Redaktors | Usui, Takamasa |