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Microelectronic Test Structures for Cmos Technology Manjul Bhushan
Microelectronic Test Structures for Cmos Technology
Manjul Bhushan
Test structures are becoming more important in the development of CMOS technologies. Covering the basic concepts in test structure design for dedicated test vehicles, the book also examines high-speed characterization techniques for digital CMOS applications.
373 pages, 37 black & white tables, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2014. gada 1. oktobris |
| ISBN13 | 9781489990556 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 373 |
| Izmēri | 155 × 235 × 21 mm · 566 g |
| Valoda | Angļu |
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