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Advanced Scanning Electron Microscopy and X-Ray Microanalysis Patrick Echlin Softcover reprint of the original 1st ed. 1986 edition
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.
466 pages, 357 black & white illustrations, 7 colour illustrations, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2013. gada 8. jūnijs |
| ISBN13 | 9781475790290 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 454 |
| Izmēri | 152 × 229 × 24 mm · 630 g |
| Valoda | Angļu |
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