Pastāsti draugiem par šo preci:
Extreme Statistics in Nanoscale Memory Design - Integrated Circuits and Systems Amith Singhee
Extreme Statistics in Nanoscale Memory Design - Integrated Circuits and Systems
Amith Singhee
This comprehensive book explains the problem of estimating statistics of memory performance variation induced due to IC manufacturing process variations. It further provides solutions recently proposed in the Electronic Design Automation (EDA) community.
246 pages, biography
| Mediji | Grāmatas Paperback Book (Grāmata ar mīksto vāku un līmēto muguru) |
| Izlaists | 2012. gada 5. novembris |
| ISBN13 | 9781461426721 |
| Izdevēji | Springer-Verlag New York Inc. |
| Lapas | 246 |
| Izmēri | 155 × 235 × 13 mm · 367 g |
| Valoda | Angļu |
| Redaktors | Rutenbar, Rob A. |
| Redaktors | Singhee, Amith |
Vairāk no Amith Singhee
Rādīt visuMere med samme udgiver
Skatīt visus Amith Singhee ( piem., Hardcover Book un Paperback Book )